The role of IBIS in near-field Emission Prediction of ICs

Transcription

1 The role of IBIS in near-field Emission Prediction of ICs Etienne SICARD, Alexandre BOYER Gilles PERES March 2005 E. Sicard-IBIS summit DATE 05 1/14

2 Table of contents Context Near-Field Scanning The IC-EMC software Near-field simulation Experiments Conclusion March 2005 E. Sicard-IBIS summit DATE 05 2/14

3 1. Context Critical Embedded Systems More Complex Embedded electronic systems 32b Micro-controler units Interfere with Mobile 0.9,1.8,1.9GHz Interfere with Airbags 100MHz Interfere with Computer 2.45Ghz Interfere with ABS 100MHz March 2005 E. Sicard-IBIS summit DATE 05 3/14

4 1. Context Critical Embedded Systems Existing methods and tools for IC emission Measurement methods Standard Models Radiated DC-1GHz IEC Ibis (Package, I/Os) ANSI EIA 656 IEC Conducted DC-1GHz IEC ICEM (Core) IEC Above 1GHz Under standardization March 2005 E. Sicard-IBIS summit DATE 05 4/14

5 1. Context Critical Embedded Systems Help to simulate IC Electromagnetic Emission before fabrication Architectural Design IC DESIGN Design Entry Design Architect EMC Guidelines Ibis model ICEM model Tools EMC Simulations Compliance? NO GO GO IC FABRICATION EMC measurement GO 28/02/2005March 2005 E. Sicard - EMC for ICs/EMC issues-ibis summit DATE 05 5/14

6 2. Near-Field scanning Measured Near field scan From IZM Package Parasites (Ibis) R,L,C IC size Pin location ICEM Model Time domain Simulation Fourier Transform of the current WinSPICE IC-Emc Current Dipole Magnetic field Tuning March 2005 E. Sicard-IBIS summit DATE 05 6/14

7 2. Near-Field scanning Measurement Hx, 40MHz Hx, 120MHz Hy similar, Hz less important Also Ex, Ey, Ez, but less important March 2005 E. Sicard-IBIS summit DATE 05 7/14

8 3. The IC-EMC software Schematic Editor, post processor Package model Supply model Access to EMC analysis IC core model Basic symbols March 2005 E. Sicard-IBIS summit DATE 05 8/14

9 3. The IC-EMC software Use IBIS information to build the supply network Equivalent R,L,C of supply networks Buffer strength Package size IC size March 2005 E. Sicard-IBIS summit DATE 05 9/14

10 4. Near field simulation Construct ICEM models March 2005 E. Sicard-IBIS summit DATE 05 10/14

11 4. Near field simulation Specific Interface for Near-field scan z θ Hr=0 l r Hθ=0 y x I 0 e jωt φ H φ = I 0 l e t βr) jω 1 sinθ + 2 4π cr r j( ϖω March 2005 E. Sicard-IBIS summit DATE 05 11/14

12 5. Experimental Results CESAME Norm Core Simulation at 80MHz Measurement at 80MHz March 2005 E. Sicard-IBIS summit DATE 05 12/14

13 5. Experimental Results Good correlation also obtained with C51 near-field scan Similar study undergoing on Infineon Tricore March 2005 E. Sicard-IBIS summit DATE 05 13/14

14 Conclusion Critical Embedded Systems An environment for near-field simulation has been developed The schematic diagram uses IBIS information for package and I/Os A post processor computes Hx,Hy from lead currents Interesting correlations have been demonstrated on CESAME test chip Other chips are being tested to validate the methodology The package is online at Demos at Iconic 05, EmcCompo 05, IEEE EMC 2005 Chicago March 2005 E. Sicard-IBIS summit DATE 05 14/14